As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://gst-return-filing61471.ampedpages.com/developing-robust-rtl-design-skills-for-modern-vlsi-projects-66403457